| AVS 63rd International Symposium & Exhibition | |
| 2D Materials Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | 2D+MI+SA-MoM1 Scanning Tunneling Microscopy and Spectroscopy of Air Exposure Effects on Molecular Beam Epitaxy Grown WSe2 Monolayers and Bilayers J.H. Park, Univeristy of California, San Diego, S. Vishwanath, Cornell University, X. Liu, University of Notre Dame, H. Zhou, Cornell University, S.M. Eichfeld, Pennsylvania State University, S.K. Fullerton-Shirey, University of Pittsburgh, J.A. Robinson, Pennsylvania State University, R. Feenstra, Carnegie Mellon University, J. Furdyna, University of Notre Dame, D. Jena, H.G. Xing, Cornell University, Andrew Kummel, University of California, San Diego |
| 8:40am | 2D+MI+SA-MoM2 Tuning the Trion Photoluminescence Polarization in Monolayer WS2 Aubrey Hanbicki, K.M. McCreary, M. Currie, Naval Research Laboratory, G. Kioseoglou, University of Crete, C.S. Hellberg, A.L. Friedman, B.T. Jonker, Naval Research Laboratory |
| 9:00am | 2D+MI+SA-MoM3 Invited Paper Quantum Hall Effect in Graphene Visualized through Scanning Tunneling Microscopy and Spectroscopy Adina Luican-Mayer, University of Ottawa, Canada |
| 9:40am | 2D+MI+SA-MoM5 Enhancing the Electrical Conductivity of VUV-reduced Graphene Oxide by Multilayered Stacking Yudi Tu, T. Utsunomiya, T. Ichii, H. Sugimura, Kyoto University, Japan |
| 10:00am | 2D+MI+SA-MoM6 Silicene-like Reconstruction via Surface Relaxation of Hexagonal-MoSi2 Crystallites Cameron Volders, P. Reinke, G. Ramalingam, E. Monzami, University of Virginia |
| 10:40am | 2D+MI+SA-MoM8 Invited Paper Electron Dynamics in Two-Dimensional Materials Philip Hofmann, Aarhus University, Denmark |
| 11:20am | 2D+MI+SA-MoM10 Novel Characterization Techniques for 2D Materials: Visualizing Inherent and External Defects Rudresh Ghosh, S.K. Banerjee, D. Akinwande, University of Texas at Austin |
| 11:40am | 2D+MI+SA-MoM11 Anomalous Dynamical Behavior of Freestanding Graphene Paul Thibado, M. Ackerman, P. Kumar, S. Singh, University of Arkansas, M. Neek-Amal, F. Peeters, University of Antwerp, Belgium |