| AVS 63rd International Symposium & Exhibition | |
| Tribology Focus Topic | Wednesday Sessions |
| Session TR+AS+NS+SS-WeA |
| Session: | Nanoscale Wear: Applications to Nanometrology and Manufacturing |
| Presenter: | Michael L. Falk, Johns Hopkins University |
| Authors: | Y. Shao, Johns Hopkins University T.D.B. Jacobs, University of Pittsburgh M.L. Falk, Johns Hopkins University |
| Correspondent: | Click to Email |