AVS 63rd International Symposium & Exhibition
    Surface Science Wednesday Sessions
       Session SS+2D-WeM

Paper SS+2D-WeM3
Novel Approaches to Form Organic-Inorganic Interfaces: Parallels between Coupling and Surface Modification Schemes in Vacuum and in Wet Chemistry

Wednesday, November 9, 2016, 8:40 am, Room 104D

Session: Synthesis, Characterization, and Surface Science of Novel Materials and Interfaces
Presenter: Andrew Teplyakov, University of Delaware
Correspondent: Click to Email
Recent interest towards controlled formation of organic-inorganic interfaces affected greatly the approaches used for surface modification of semiconductors. Despite substantial progress in designing chemical pathways for surface modification of these materials and synthetic capabilities to build a variety of precursor molecules, two major issues remain: 1) Can the same level of precision achieved for surface characterization in vacuum be achieved for surfaces modified by wet chemistry methods; and 2) Can the elemental and compound semiconductor surfaces be modified with chemical groups that are both oxygen- and carbon-free. These two questions will be addressed by drawing parallels between cyclocondensation processes on modified semiconductor surfaces and cycloaddition in vacuum. Mixed surface modification schemes will be discussed for silicon and ZnO materials to produce high-coverage chemical “hooks” and the use of these functionalities will be demonstrated for initial stages of film deposition or depositing large constructs (nanoparticles and buckyballs) by chemical addition to produce strong covalent bonds. The addition across double bonds of carbonaceous constructs and the production of chemical bonds by straightforward chemical reactions will be discussed. The reactions for producing amino-functionalities and the platforms for “click” reactions will be presented. The experimental evidence of the reactions will be based on infrared spectroscopy, X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS) and a combination of microscopic techniques. The selected results of the experimental work will be compared with the experimental observables predicted by density functional theory (DFT).