AVS 63rd International Symposium & Exhibition | |
Surface Science | Wednesday Sessions |
Session SS+2D-WeM |
Session: | Synthesis, Characterization, and Surface Science of Novel Materials and Interfaces |
Presenter: | Jory Yarmoff, University of California - Riverside |
Authors: | J.A. Yarmoff, University of California - Riverside W. Zhou, University of California - Riverside H. Zhu, University of California - Riverside |
Correspondent: | Click to Email |
A topological insulator (TI) is a two-dimensional material that behaves as an insulator in the bulk, but conducts along the surface via topologically protected surface states. TI’s have attracted intense interest because of their fundamental importance combined with great potential for applications in areas such as spintronics and quantum computation. Because the critical electronic states in TI’s are localized in the near-surface region, it is critical to understand their surface composition, surface atomic structure and surface chemistry, and there are several outstanding issues that have not been fully resolved. For example, the materials are often naturally doped leading to the Fermi energy residing in the conduction band. Some materials have also been observed to change over time, the so-called “aging effect”. In addition, the surface termination of the prototypical TI, Bismuth Selenide (Bi2Se3), has been an area of recent debate. Although some studies have demonstrated that the cleaved surface is terminated with Se, as expected from the bulk crystal structure, there are other reports that show either a Bi-rich or mixed-termination.
We are using low energy ion scattering (LEIS), in conjunction with other surface analysis tools, to investigate the surface composition and atomic structure of TI materials prepared in numerous ways. LEIS is uniquely suited to measure surface termination and atomic structure, as it provides the elemental identification of the near-surface region and can be deployed to probe only the outermost atomic layer. We compared surfaces prepared by ex situ cleaving, in situ cleaving and Ar+ ion bombardment and annealing (IBA) in ultra-high vacuum. LEIS measurements do not indicate any substantial differences between the Se-terminated surfaces prepared by IBA or in-situ cleaving. Samples inserted into the vacuum chamber following ex-situ cleaving are less well-ordered, show adsorbed oxygen and can be either Se-terminated or Bi-rich, which suggests a critical dependence on the level of contamination. We have also used molecular beam epitaxy to investigate the structure and stability of Bi overlayers grown on Bi2Se3. Additional experiments involve exposure of clean surfaces to gaseous species such as O2, H2 and Br2.