AVS 63rd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Tuesday Sessions
       Session SP-TuP

Paper SP-TuP7
Nanoscopy of Black Phosphorus Degradation

Tuesday, November 8, 2016, 6:30 pm, Room Hall D

Session: Scanning Probe Microscopy Poster Session
Presenter: Sampath Gamage, Georgia State University
Authors: S. Gamage, Georgia State University
L. Zhen, University of Southern California
V.E. Babicheva, Georgia State University
M. Javani, Georgia State University
V.S. Yakovlev, Georgia State University
H. Wang, University of Southern California
S. Cronin, University of Southern California
Y. Abate, Georgia State University
Correspondent: Click to Email
Black phosphorus (BP) is a promising layered material for optoelectronics applications due to its outstanding physical properties. Importantly, the thickness-dependent tunable direct bandgap of BP excited material scientists over graphene that lacks a natural bandgap. Similar to graphene, BP can be prepared commonly and simply by mechanical exfoliation. However, the major impediment of the BP based research is its surface degradation when exposed to atmospheric water and oxygen. In order to develop BP as a material for aforementioned applications, it is essential to understand degradation process at nanoscale chemical resolved resolution. In this poster contribution, we present our findings of the nanoscale spectroscopy degradation study of BP using scattering type scanning near-field optical microscopic (s-SNOM) technique at several mid infrared wavelengths. We have experimentally investigated the thickness dependence and substrate influence of a set of uncoated and Al2O3 coated samples and theoretically modeled the degradation evolution.