AVS 63rd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Tuesday Sessions
       Session SP+AS+MI+NS+SS-TuM

Invited Paper SP+AS+MI+NS+SS-TuM12
Atomic Force Microscopy: A Tool for Chemical Analysis of Surfaces and Molecules on Atomic Scale

Tuesday, November 8, 2016, 11:40 am, Room 104A

Session: Probing Chemical Reactions at the Nanoscale
Presenter: Pavel Jelinek, Institute of Physics of the AS CR, Czech Republic
Correspondent: Click to Email

Atomic resolution and manipulation is routinely achieved by both scanning tunneling microscopy (STM) and atomic force microscopy (AFM) nowadays. Despite of large activities in development of the scanning probe technique, still some challenges remain, namely the chemical analysis on atomic and molecular level.

First, we will present a novel method extending further the chemical analysis [1,2] by means of AFM. Namely we will discuss a new methodology to measure Pauling’s electronegativity of individual atoms on surfaces using AFM. Electronegativity has been an important concept in chemistry, originally defined by Pauling as “the power of an atom in a molecule to attract electrons to itself”. However, its experimental determination on individual surface atoms was not possible so far.

Second, we will discuss the origin of sub molecular AFM/STM resolution acquired with functionalized tips. We will show that the electrostatic force can substantially affect the sub molecular contrast. We will show, that the electrostatic potential on a single molecule can be mapped out with sub molecular resolution.

[1] Y. Sugimoto et al Nature 446, 64 (2007)

[2] M. Setvin et al ACS Nano 6, 6969 (2012)

[3] P. Hapala et al, Phys. Rev. Lett. 113, 226101 (2014)

[4] J. vad der Lit et al, Phys. Rev. Lett. 096102 (2016)

[5] P. Hapala et al. Nature comm. (accepted 2016)