AVS 63rd International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Tuesday Sessions |
Session SP+AS+MI+NS+SS-TuA |
Session: | Probing Spin-Dependent Phenomena |
Presenter: | MinHui Chang, Korea University, Republic of Korea |
Authors: | M.H. Chang, Korea University, Republic of Korea S.J. Kahng, Korea University, Republic of Korea Y.H. Chang, Korea Advanced Institute of Science and Technology (KAIST), Republic of Korea H.W. Kim, Korea University, Republic of Korea S.H. Lee, Korea University, Republic of Korea Y.-H. Kim, KAIST, Republic of Korea |
Correspondent: | Click to Email |