AVS 63rd International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Tuesday Sessions |
Session SP+AS+MI+NS+SS-TuA |
Session: | Probing Spin-Dependent Phenomena |
Presenter: | Wonhee Ko, Samsung Advanced Institute of Technology, Republic of Korea |
Authors: | W. Ko, Samsung Advanced Institute of Technology, Republic of Korea H.W. Kim, Samsung Advanced Institute of Technology Y. Cho, Samsung Advanced Institute of Technology Y. Kuk, Seoul National University, Korea, Republic of Korea S.W. Hwang, Samsung Advanced Institute of Technology |
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