AVS 63rd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Tuesday Sessions
       Session SP+AS+MI+NS+SS-TuA

Paper SP+AS+MI+NS+SS-TuA11
The Use of Scanning Probe Techniques to Study the Behaviour of Second Phase Particles in Beryllium and Their Role in Localised Corrosion

Tuesday, November 8, 2016, 5:40 pm, Room 104A

Session: Probing Spin-Dependent Phenomena
Presenter: Christopher Mallinson, University of Surrey, UK
Authors: C.F. Mallinson, University of Surrey, UK
J.F. Watts, University of Surrey, UK
Correspondent: Click to Email

Scanning Kelvin probe force microscopy (SKPFM) has been employed to examine the galvanic activity of a wide range of second phase particles in S-65 beryllium that are believed to have a role in the localised corrosion of the metal. SKPFM and AFM analysis has been combined with additional surface and bulk analysis techniques of scanning electron microscopy, energy dispersive x-ray spectroscopy and Auger electron spectroscopy to provide a detailed overview of the link between the bulk and surface composition of particles and their Volta potential or surface contact potential.

Initial results appear to show that all second phase particles are more noble than the beryllium matrix with the greatest potential difference observed for AlFeBe4 and alumina or carbide like particles. The more negative Volta potential indicates that the particles should act as local cathodes when the metal is exposed to an aqueous environment.

The initial investigation, which is being performed in-air, will be expanded to determine the effect of increasingly higher humidity environments on the behaviour of the particles. It is hoped that this will provide a greater understanding about the onset of pitting corrosion in beryllium.