AVS 63rd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Monday Sessions
       Session SP+AS+MI+NS+SS-MoM

Paper SP+AS+MI+NS+SS-MoM3
Development and Integration of a Universal SPM head: Design Criteria and Challenges

Monday, November 7, 2016, 9:00 am, Room 104A

Session: Advances in Scanning Probe Microscopy
Presenter: Andreas Bettac, Sigma Surface Science GmbH, Germany
Authors: B. Guenther, Sigma Surface Science GmbH, Germany
J. Hilton, Mantis Deposition
A. Feltz, Sigma Surface Science GmbH
A. Bettac, Sigma Surface Science GmbH, Germany
Correspondent: Click to Email

Recently we have developed an SPM microscope head that merges the needs for high resolution STM/QPlus1-AFM and at the same time satisfies the requirements for integration into different cryogen environments including tip and sample handling.

The new SPM head was integrated into different platforms, e.g. in a UHV Helium Flow Cryostat system for temperatures <10K and in a 3He Magnet Cryostat UHV system for high magnetic fields (±12T) and temperatures <400mK.

This contribution focuses on design aspects and challenges for the new SPM head with respect to spatial restrictions, sample sizes/standards, QPlus and STM signal shielding as well as on first results (STM, STS and QPlus) obtained with the different instrumental setups.

[1] F. J. Giessibl, Applied Physics Letters 73 (1998) 3956