| AVS 63rd International Symposium & Exhibition | |
| Scanning Probe Microscopy Focus Topic | Monday Sessions |
| Session SP+AS+MI+NS+SS-MoM |
| Session: | Advances in Scanning Probe Microscopy |
| Presenter: | Nozomi Shirato, Center for Nanoscale Materials at Argonne National Laboratory |
| Authors: | N. Shirato, Center for Nanoscale Materials at Argonne National Laboratory H. Chang, Ohio University M. Cummings, Advanced Photon Source at Argonne National Laboratory S.W. Hla, Center for Nanoscale Materials at Argonne National Laboratory V. Rose, Advanced Photon Source at Argonne National Laboratory |
| Correspondent: | Click to Email |
Advancements of scanning probe microscopy have been contributing to broaden fundamental understating of surface physics. By combining high intense X-ray beam as a probe and a functionalized tip as a detector, synchrotron X-ray scanning tunneling microscopy has been developed in Advanced Photon Source at Argonne National Laboratory. The recent studies demonstrated the technique has capabilities to extract chemical information with sensitivity at the atomic limit [1] and localized magnetic contrast by utilizing polarized beams [2]. Furthermore, at Argonne, in order to fully exploit potentials of the microscope, a dedicated beamline is under construction. The soft X-ray beamline has the energy range of 400 to 1600 eV and is equipped with a polarizer and focusing optics. The capabilities of the beamline will benefit the communities to explore chemical, magnetic and electronic properties of materials at atomic resolution.
References
[1] N. Shirato et al., Nano Letters 14, 6499 (2014).
[2] A. DiLullo et al., J. Synchrotron Rad. 23, 574 (2016).