AVS 63rd International Symposium & Exhibition | |
Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Tuesday Sessions |
Session SA+AS+BI+MI-TuA |
Session: | Synchrotron and XFEL Advances for Biological Systems (2:20-3:40 pm)/Synchrotron Radiation at the Frontiers of Device Technology (4:20-6:20 pm) |
Presenter: | Michael Martin, Lawrence Berkeley National Laboratory |
Correspondent: | Click to Email |
Synchrotron infrared beamlines use the diffraction-limited beam properties to enable a variety of cutting edge science - how can we go further?
By combining scattering-scanning near-field optical microscopy (s-SNOM) with mid-infrared synchrotron radiation, synchrotron infrared nano-spectroscopy (SINS) enables molecular and phonon vibrational spectroscopic imaging, with rapid spectral acquisition, spanning the full mid-infrared (500-5000 cm-1) region with nanoscale spatial resolution. This highly powerful combination provides access to a qualitatively new form of nano-chemometric analysis with the investigation of nanoscale, mesoscale, and surface phenomena that were previously impossible to study with IR techniques. We have installed a SINS end-station at Beamline 5.4 at the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory, making the s-SNOM technique widely available to non-experts, such that it can be broadly applied to biological, surface chemistry, materials, or environmental science problems. We demonstrate the performance of synchrotron infrared nano-spectroscopy (SINS) on semiconductor, biomineral and protein nanostructures, providing vibrational chemical imaging with sub-zeptomole sensitivity.
The spatial field localization at the tip apex can also result in a large near-field momentum sufficient to optically excite phonon polaritons (PhPs), which are quasiparticles resulting from the strong coupling of photons with optical phonons. Here, we use SINS to image the PhP spectral response in thin hexagonal boron nitride (hBN) crystals. The large spectral bandwidth of the synchrotron source enables the simultaneous measurement of both the out-of-plane (780 cm-1) and in-plane (1370 cm-1) hBN phonon modes. In contrast to the strong and dispersive in-plane mode, the out-of-plane mode PhP response is weak. Measurements of the PhP wavelength reveal a proportional dependence on sample thickness for thin hBN flakes [2].
This talk will present the novel SINS instrumentation and a variety of scientific examples. Future directions, both technical and scientific, will be discussed.
*With Hans A Bechtel, Markus B. Raschke, Z. Shi, F. Wang, R.W. Johns, D.J. Miliron, E.A. Muller, R.L. Olmon
References[1] H.A. Bechtel et al., Proceedings of the National Academy of Sciences of the USA, 111(20), 7191–7196 (2014)
[2] Z. Shi, H.A. Bechtel, S. Berweger, Y. Sun, B. Zeng, C. Jin, H. Chang, M.C. Martin, M.B. Raschke, and F. Wang, ACS Photonics 2 (7), 790-796 (2015).