AVS 63rd International Symposium & Exhibition
    Magnetic Interfaces and Nanostructures Monday Sessions
       Session MI+2D+AC-MoM

Paper MI+2D+AC-MoM10
How to do Depth-Dependent Measurements on Magnetic or Magnetoelectric Thin Films

Monday, November 7, 2016, 11:20 am, Room 101C

Session: Chiral Magnetism (8:20-10:20 am)/Magnetism and Spin Orbit Effects at Interfaces and Surfaces: Recent Experimental and Theoretical Advances (10:40 am - 12:00 pm)
Presenter: Mikel Holcomb, West Virginia University
Authors: M.B. Holcomb, West Virginia University
R. Trappen, West Virginia University
J. Zhou, West Virginia University
C-Y. Huang, West Virginia University
G. Cabrera, West Virginia University
S. Dong, Southeast University
Y-H. Chu, National Chiao Tung University, Taiwan
Correspondent: Click to Email

Analysis of depth-dependent measurements can provide useful information on how material properties change near surfaces or interfaces with other materials. For example, this deviation commonly occurs in magnetic thin films and the variation of these properties can strongly influence how different materials couple with one another. We have recently utilized a combined approach of bulk and surface sensitive x-ray absorption techniques to nondestructively map out depth-dependent atomic valence and magnetization across magnetic La0.7Sr0.3MnO3 and magnetoelectric La0.7Sr0.3MnO3/PbZr0.2Ti0.8O3 thin films. We have combined measurements on multiple sample thicknesses with theoretical approaches to map out the layer-by-layer atomic valences and how they vary with film thickness. Such efforts may play a critical role in understanding how to build future generations of devices that rely on enhanced surface and interface properties.