| AVS 63rd International Symposium & Exhibition | |
| Electronic Materials and Photonics | Wednesday Sessions |
| Session EM+NS+SP+SS-WeA |
| Session: | Nanoscale Imaging of Metals and Compound Semiconductor based Nanostructures, Surfaces and Interfaces |
| Presenter: | Viktoriia Babicheva, Georgia State University |
| Authors: | V.E. Babicheva, Georgia State University V.S. Yakovlev, Georgia State University S. Gamage, Georgia State University M.I. Stockman, Georgia State University Y. Abate, Georgia State University |
| Correspondent: | Click to Email |
Scattering-type scanning near-field optical (s-SNOM) microscopy enable spectroscopic imaging with nanoscale resolution and provide chemical and structural information of surfaces [1]. In this work, we investigate identification of material type using an approach based on analyzing near fields at the sample edge [2]. We develop theoretical approach that includes full-wave numerical simulations and calculations of s-SNOM signal in different demodulation orders. This model allow characterization of structures of any shape and material, as well as different tips, and does not include any fitting parameters. In this way, we defined that metallic edge has bright and dark fringes in near-field characterization, whereas a bright edge of dielectric material has no outside fringe. Similar behavior is observed for anisotropic material with hyperbolic dispersion (boron nitride in mid-IR range): depending on the wavelength, it shows either metallic or dielectric properties.
1. Y. Abate, R.E. Marvel, J.I. Ziegler, S. Gamage, M.H. Javani, M.I. Stockman, and R.F. Haglund "Control of plasmonic nanoantennas by reversible metal-insulator transition" Sci. Rep. 5, 13997 (2015).
2. Y. Abate, S. Gamage, L. Zhen, S.B. Cronin, H. Wang, V. Babicheva, M.H. Javani, M.I. Stockman, “Nanoscopy reveals metallic black phosphorus,” Light: Science & Applications, accepted (2016). http://arxiv.org/abs/1506.05431