| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
| Session AS-WeA |
| Session: | Multiple Technique Approaches for Real-World Industrial Problem Solving |
| Presenter: | Kathryn Lloyd, DuPont Corporate Center for Analytical Sciences |
| Correspondent: | Click to Email |
Although there do exist types of problems or research support for which one analytical technique is sufficient to provide useful guidance or an answer, it is more the norm that multiple analytical techniques are required to address technical problems involving coatings, layered structures, and other industrial materials. In fact, basing action (e.g., a change in manufacturing process) on data from a single analytical technique -- especially a surface-specific technique – would not be advisable in most cases.
Some technique combinations seem intuitive – for example, combining the high-lateral-resolution detail from electron microscopy with the higher level of chemical information available from either secondary ion mapping (ToF-SIMS) or Raman microprobe analysis. However, there are still challenges with sample preparation, data acquisition from the same area, and data integration that need to be addressed.
Other technique combinations arise from the business need – for example, finding a combination of techniques that both describe the chemistry and correlate with end-use performance. This usually involves combining a vacuum-based technique with an ambient or “macroscopic” technique such as contact angle, porosity, or friction measurements.
As most practitioners know, the surface specificity of XPS and ToF-SIMS can be both an advantage and a disadvantage. In this regard, the introduction of GCIB (Gas Cluster Ion Beam) sources has opened up new opportunities for multiple-technique problem-solving.
This talk will present some experiences and examples that provide a flavor of multiple-technique problem-solving in an industrial environment.