| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
| Session AS-WeA |
| Session: | Multiple Technique Approaches for Real-World Industrial Problem Solving |
| Presenter: | Han Zuilhof, Wageningen University, Netherlands |
| Correspondent: | Click to Email |
The characterization of organic monolayers is critically dependent on highly surface-sensitive methods. While a wide variety of methods has been developed over the last decades, structural information of organic species, including information relating to their three-dimensional structure, was often very difficult to obtain.
The current presentation sets out to detail the potential of ambient ionization mass spectrometry for this purpose, by giving examples of where it can extend the analysis, where e.g. XPS, scanning probe microscopies and IR fall short.
Lit: Langmuir 2016, 32, 3412; Anal. Chem. 2014, 86, 2403.