| AVS 63rd International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
| Session AS-WeA |
| Session: | Multiple Technique Approaches for Real-World Industrial Problem Solving |
| Presenter: | Michael Brumbach, Sandia National Laboratories |
| Authors: | M. Brumbach, Sandia National Laboratories N. Argibay, Sandia National Laboratories D. Susan, Sandia National Laboratories J. Rodelas, Sandia National Laboratories J. Reich, Sandia National Laboratories B.L. Boyce, Sandia National Laboratories A. Roach, Sandia National Laboratories |
| Correspondent: | Click to Email |
The implementation of characterization in additive manufacturing (AM) demands new perspectives for a setting traditionally adapted to support basic science research. As the development of AM continues, the need for diagnostics and control of AM processes is critical and begins with an understanding of materials composition. This exploration of characterization techniques for analyzing bulk composition will give particular consideration for low detection limits, high-throughput analyses, and the ability to quantify light elements. Comparisons between optical emission spectroscopy (OES) from various excitation sources including glow-discharge (GDS), arc-spark, and inductively coupled plasma (ICP) will be discussed. The results are compared to X-ray fluorescence (XRF) and wavelength dispersive spectroscopy (WDS/microprobe). Combustion analysis will be discussed for carbon, sulfur, oxygen, nitrogen, and hydrogen from traditional wrought metals and AM analogs. The role of surface analysis and comparison to bulk techniques will also be demonstrated.
Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.