AVS 63rd International Symposium & Exhibition
    2D Materials Focus Topic Thursday Sessions
       Session 2D-ThP

Paper 2D-ThP7
Raman Spectroscopy and Optical Characterization of Thermoelectric Devices From Ni/Bi2Te3/Sb2Te3/Ni Thin Films

Thursday, November 10, 2016, 6:00 pm, Room Hall D

Session: 2D Materials Poster Session
Presenter: Aschalew Kassu, Alabama A&M University
Authors: A. Kassu, Alabama A&M University
S. Budak, Alabama A&M University
Z. Xiao, Alabama A&M University
R. Hammond, Alabama A&M University
X. Crutcher, Alabama A&M University
A. Sharma, Alabama A&M University
Correspondent: Click to Email

Thermoelectric devices from Ni/Bi2Te3/Sb2Te3/Ni thin films were prepared. The thin films are deposited by using DC/RF magnetron sputtering and E-beam deposition systems. The surface morphology of the fabricated thermoelectric films is characterized using Scanning Electron Microscope (SEM). Raman spectroscopic technique is used for identification of inherent molecular specificity and analysis of chemical compositions of the films. The resonant features of the scattering spectra measured under the 532 nm and 785 nm wavelength excitation lasers are analyzed.

Acknowledgement

This research was supported by NSF with grant numbers NSF-HBCU-RISE-1546965, NSF-EPSCOR-R-II-3-EPS- 1158862, DOD with grant numbers W911 NF-08-1-0425, and Department of Homeland Security-Scientific Leadership Award, Grant No. DHS-SLA 2014-ST-062-000060