AVS 62nd International Symposium & Exhibition


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Helium Ion Microscopy Focus Topic Sessions

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Start Time Session Code Session Title
Wednesday 2:20pm HI-WeA GFIS Based Nanostructuring
Thursday 8:00am HI+AS+SS+NS-ThM Focused Ion Beam Technology (08:00-10:00)/Fundamentals of Helium Ion Microscopy (11:00-12:20)
Thursday 2:20pm HI+AS+NS-ThA Imaging and Milling with He and Ne Ion Beams

AVS 62nd International Symposium & Exhibition