| 8:00am |
AS-WeM1 Invited Paper
ASSD 30th Anniversary Lecture: A Historical Perspective of the Materials Challenges and Instrumentation Solutions Available for Practical X-ray Photoelectron and Auger Electron Spectroscopy
John Moulder, Physical Electronics USA |
| 8:40am |
AS-WeM3
Using Argon clusters for Improved XPS Information
Jonathan Counsell, S.J. Coultas, C.J. Blomfield, D. Surman, C. Moffitt, Kratos Analytical Limited, UK |
| 9:00am |
AS-WeM4
In Situ Chemical Imaging of Environmental Liquid Surfaces and Interfaces Using Microfluidics and Dynamic ToF-SIMS: Toward Multimodal and Mesoscale Imaging
Xiao-Ying Yu, Z. Zhu, Pacific Northwest National Laboratory |
| 9:20am |
AS-WeM5
A VAMAS Inter-laboratory Study of the Measurement of Chemistry and Thickness of Nanoparticle Coatings
David Cant, N.A. Belsey, C. Minelli, A. Shard, National Physical Laboratory, UK |
| 11:00am |
AS-WeM10
A Quantitative Quest: Single Cell Analysis by LG-SIMS
Christopher Szakal, National Institute of Standards and Technology (NIST) |
| 11:20am |
AS-WeM11
Ambient Mass Spectrometry Imaging of Live Cells and Tissues
J.K. Kim, DaeWon Moon, DGIST, Republic of Korea |
| 11:40am |
AS-WeM12 Invited Paper
Intricacies of Sample Preparation for ToF-SIMS Analysis of Biological Specimens
John Fletcher, Chalmers University of Technology, Sweden |