| AVS 62nd International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | AS+SS-WeA1 Invited Paper ASSD 30th Anniversary Speaker: Characterization of Sub-surface Interfaces using SIMS, TEM, and FIB or: How Much will it Cost me to Fix that Interface? Fred Stevie, North Carolina State University |
| 3:00pm | AS+SS-WeA3 FIB-TOF Tomography Characterization of Organic Structures David Carr, G.L. Fisher, Physical Electronics USA, S. Iida, T. Miyayama, ULVAC-PHI |
| 4:20pm | AS+SS-WeA7 Invited Paper Interface Characterization using Ballistic Electron Emission Microscopy and Spectroscopy: Recent Results and Related Techniques Douglas Bell, Jet Propulsion Laboratory, California Institute of Technology |
| 5:00pm | AS+SS-WeA9 Using XPS to Study Electrochemical Solid-Liquid Interfaces In-Operando: Standing-Wave Ambient-Pressure XPS (SWAPPS) Osman Karslioglu, Lawrence Berkeley National Laboratory, S. Nemsak, Forschungszentrum Juelich GmbH, Germany, I. Zegkinoglou, A. Shavorskiy, M. Hartl, C.S. Fadley, H. Bluhm, Lawrence Berkeley National Laboratory |
| 5:20pm | AS+SS-WeA10 Exploring the Usefulness of Monochromatic Ag Lα X-rays for XPS Sarah Coultas, J.D.P. Counsell, S.J. Hutton, A.J. Roberts, C.J. Blomfield, Kratos Analytical Limited, UK |
| 5:40pm | AS+SS-WeA11 Optimizing the TOF-SIMS CsM+ Depth Profile of a Tunnel Magneto Resistance (TMR) Structure Alan Spool, HGST, a Western Digital Company |
| 6:00pm | AS+SS-WeA12 Interface and Composition Analyses versus Performances: How to Improve Perovskite Solar Cells Y. Busby, University of Namur, B-5000 Namur, Belgium, F. Matteocci, University of Rome “Tor Vergata”, Italy, G. Divitini, S. Cacovich, University of Cambridge, UK, C. Ducati, University of Cambridge, A. di Carlo, University of Rome “Tor Vergata”, Italy, Jean-Jacques Pireaux, University of Namur, Belgium |