| AVS 62nd International Symposium & Exhibition | |
| Atom Probe Tomography Focus Topic | Monday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:20am | AP+AS+MC+MI+NS-MoM1 Invited Paper Correlative Multi-scale Analysis of Nd-Fe-B Permanent Magnet Taisuke Sasaki, T. Ohkubo, K. Hono, National Institute for Materials Science (NIMS), Japan |
| 9:00am | AP+AS+MC+MI+NS-MoM3 Invited Paper Atom-Probe Tomography of Materials with Dimensions in the Nanometer Range Dieter Isheim, Northwestern University |
| 9:40am | AP+AS+MC+MI+NS-MoM5 Exploring Atom Probe Tomography for Energy Storage and Conversion Materials Pritesh Parikh, University of California, San Diego, A. Devaraj, Pacific Northwest National Laboratory, S. Meng, University of California, San Diego |
| 10:00am | AP+AS+MC+MI+NS-MoM6 Atom Probe Tomography of Pt-based Nanoparticles Katja Eder, P.J. Felfer, J.M. Cairney, The University of Sydney, Australia |
| 10:40am | AP+AS+MC+MI+NS-MoM8 Invited Paper APT & TEM Observations on Local Crystallization of NbO2 used in Switching Devices J.-H. Lee, Pohang University of Science and Technology (POSTECH), Samsung Electronics, Republic of Korea, J.-B. Seol, C.-G Park, Pohang University of Science and Technology (POSTECH), National Institute for Nanomaterials Technology (NINT), Republic of Korea |
| 11:20am | AP+AS+MC+MI+NS-MoM10 Invited Paper Correlating Atom Probe Tomography with High-Resolution Scanning Transmission Electron Microscopy and Micro-Photoluminescence Spectroscopy: The Case of III-Nitride Heterostructures Lorenzo Rigutti, University of Rouen |