AVS 62nd International Symposium & Exhibition
    Thin Film Thursday Sessions
       Session TF+PS-ThA

Paper TF+PS-ThA3
Investigation on Nano-Porosity in Moisture Permeation Barrier Layers by Electrochemical Impedance Spectroscopy

Thursday, October 22, 2015, 3:00 pm, Room 114

Session: Thin Film Permeation Barriers and Membranes
Presenter: Alberto Perrotta, Eindhoven University of Technology, Netherlands
Authors: A. Perrotta, Eindhoven University of Technology, Netherlands
S.J. Garcia Espallargas, Delft University of Technology, Netherlands
J.J. Michels, Max Planck Institute for Polymer Research, Germany
M. Creatore, Eindhoven University of Technology, Netherlands
Correspondent: Click to Email

High-tech devices relying on organic semiconductors require device encapsulation against moisture and oxygen permeation, which would otherwise negatively affect the device opto-electrical performance.

The water permeation in inorganic moisture barriers has been shown to occur through macro-scale defects/pinholes (ranging from tens of nms to several μms) and nano-pores, down to sizes approaching the water kinetic diameter (0.27 nm). Both permeation paths can be identified by the calcium test, which allows discerning between the effective water vapor transmission rate (WVTR) and the intrinsic WVTR, the latter solely attributed to the permeation through the nano-porosity characterizing the bulk of the barrier layer. Recently [1], we have shown that ellipsometric porosimetry (EP) is a valid method to classify and quantify the nano-porosity content of inorganic barriers and a correlation has been found between their relative pore content and intrinsic WVTR values [1]. However, no information can be retrieved on the macro-scale defects nor on the kinetics of water permeation through the barrier, both essential elements in assessing the quality of the barrier layer.

In this study, electrochemical impedance spectroscopy (EIS) is demonstrated as a sensitive method to obtain quantitative information on both nano-porosity and macro-scale defects, complementing the barrier property characterization obtained by means of EP and calcium test.

EIS analysis is carried out on thin SiO2 barrier layers deposited by plasma enhanced-CVD. The layer capacitance has been determined by modelling the impedance data with the proper equivalent circuit and the change of the capacitance upon water permeation has been followed. The Brasher-Kingsbury equation has been successfully applied and water uptake in the range of 0.8-4% have been found, in agreement with the nano-porosity content inferred by EP. A good linear correlation between the nano-porosity and the values of the electrical components used in the fitting procedure of the EIS data has been obtained, suggesting the direct calculation of open nano-porosity from an EIS fit. Furthermore, the kinetics of water permeation can be followed by EIS: the water diffusivity for the SiO2 layers has been determined and found in agreement with literature values. Moreover, differently from ellipsometry-based techniques, EIS data are shown to be sensitive to the presence of local macro-defects, inferring its possible use for the prediction of the barrier performance with the calcium test.

[1] A. Perrotta et al., Microporous Mesoporous Mat., 188 (2014) 163-171