AVS 62nd International Symposium & Exhibition
    Thin Film Wednesday Sessions
       Session TF+AS+BI-WeA

Invited Paper TF+AS+BI-WeA1
On-chip Characterization of Engineered Nanomaterial Surface Properties by Real-time Affinity Monitoring

Wednesday, October 21, 2015, 2:20 pm, Room 114

Session: Thin Films for Biological and Biomedical Applications
Presenter: Francois Rossi, European Commission, Joint Research Centre (JRC), Italy
Authors: C. Desmet, European Commission, Joint Research Centre (JRC)
A. Valsesia, European Commission, Joint Research Centre (JRC)
P. Colpo, European Commission, Joint Research Centre (JRC)
F.J. Rossi, European Commission, Joint Research Centre (JRC), Italy
Correspondent: Click to Email

The exhaustive characterization of the physico-chemical properties of engineered nanomaterials (ENMs) is essential to understand their mode of action and potential impact on health and environment. The development of characterization methods has been the object of important work in the past years, and has led to a better understanding on the ENM interaction with cellular systems and living organisms. One of the important surface properties of ENMs is the surface energy, for which there is no standard characterization technique established. Here, we demonstrate the feasibility of a characterization method based on a disposable microfluidic chip connected to an optical reader. The detection platform is based on the use of a micropatterned surface with tuned surface properties to bind ENMs selectively by hydrophobic forces and electrostatic interactions. The real-time absorption of ENMs on the differently functionalized micro domains is monitored by a microscope-coupled camera and gives information on the kinetics of adsorption, related to the affinity of the ENMs for the different surfaces as a function of their sizes and shapes. Interpretation of the results within the extended DLVO theory allows retrieving the surface energy characteristics of the ENMs surfaces. The key advantage of the device is the increase of the characterization throughput thanks to the all-in-one characterization process and the multiplexing that is able to replace the use of different methods and expensive equipment. In this way, the full characterization of ENMs could be expanded in all the areas covering nanomaterial-related applications.