AVS 62nd International Symposium & Exhibition
    Surface Science Tuesday Sessions
       Session SS-TuP

Paper SS-TuP9
Photocatalytic Properties of TiO2/NiO/Cu2O Thin Films Prepared by Reactive Magnetron Sputtering

Tuesday, October 20, 2015, 6:30 pm, Room Hall 3

Session: Surface Science Poster Session
Presenter: Toshiya Souma, Kogakuin University, Japan
Authors: T. Souma, Kogakuin University, Japan
I. Takano, Kogakuin University, Japan
Correspondent: Click to Email

In recent years, various characteristics of TiO2 have attracted considerable attention. One of their characteristics is a photocatalytic effect. The photocatalytic effect of TiO2 shows antifouling or antimicrobial activity, and has the ability to decompose environmental pollutants. Thus TiO2 has superior characteristics in many metal oxides, because its photo-excited state is very stable and does not cause self-decomposition. Therefore, TiO2 can perform the electrolysis of water by light, however, a light reaction region of TiO2 is limited within the ultraviolet region corresponded with only about 3 % of sunlight.

In this study, to improve the photocatalytic property of TiO2 the TiO2/NiO/Cu2O thin films were fabricated by laminating the TiO2 layer with 3.0 - 3.2 eV and the Cu2O layer with 2.2 eV in a band gap energy. In order to prevent the diffusion of Cu, the NiO layer was inserted between the TiO2 layer and the Cu2O layer. NiO has a high melting point, high hardness and has been used as a barrier layer. These three layers were prepared by reactive magnetron sputtering.

The film composition and microstructure were investigated by X-ray photoelectron spectroscopy and X-ray diffraction, respectively. Chromatic changes of a methylene blue solution were applied to the measurement of a photocatalytic property. Light irradiation to the TiO2/NiO/Cu2O thin films in a methylene blue solution was carried out using a commercial sterilizing lamp as ultraviolet light and an artificial sun lamp as visible light. Transmittance of a methylene blue solution was measured by a spectrophotometer.

On the XRD measurement for the crystal structure of TiO2/NiO/Cu2O thin films, the strong peaks of the anatase-rutile mixture from TiO2 of the upper layer and the weak peaks of Cu2O or NiO from the lower layer appeared. It was estimated that the diffusion of Cu from the Cu2O layer was prevented by inserting the NiO layer. The suitable photocatalytic effect was obtained by inserting the NiO layer of 20 nm in a thickness and then the decomposition activity of a methylene blue solution showed about 57 % under an artificial sun light and about 77 % under a sterilization light. In the case of TiO2/NiO/Cu2O thin films, it was considered that the role of the NiO layer was not only the protection of the diffusion but also the electric effect as a p-type semiconductor.