AVS 62nd International Symposium & Exhibition
    Scanning Probe Microscopy Focus Topic Wednesday Sessions
       Session SP+2D+AS+NS+SS-WeA

Paper SP+2D+AS+NS+SS-WeA7
Electronic Properties of Quasi-one-dimensional Defects in Monolayer h-BN

Wednesday, October 21, 2015, 4:20 pm, Room 212A

Session: Probing Electronic and Transport Properties
Presenter: Chuanxu Ma, Oak Ridge National Laboratory
Authors: C. Ma, Oak Ridge National Laboratory
J. Park, Oak Ridge National Laboratory
L. Liu, The University of Tennessee
G. Gu, The University of Tennessee
A.P. Baddorf, Oak Ridge National Laboratory
A.-P. Li, Oak Ridge National Laboratory
Correspondent: Click to Email

Two-dimensional (2D) hexagonal boron nitride (h-BN) monolayers have wide promising applications in nanoelectronics. The presence of defects could greatly impact its electronic properties. Here, we present experimental results about two types of line defects in h-BN monolayers, prepared on Cu foils by chemical vapor deposition (CVD) method.

Using scanning tunneling microscopy/spectroscopy (STM/STS), the structural and electronic properties of two types of quasi-1D defects are characterized in monolayer h-BN. An energy gap ~4 Ev is observed for h-BN monolayers on Cu foils. The first type of quasi-1D defects is the worm-like defects with length 3~30 nm, and width ~1.5 nm. Nano-ripples with modulation λ ~ 5.2 Å, which is about double the size of h-BN lattice, are observed both from the topographic images and Di/Dv mappings along the worm-like defects. The modulation is in phase at negative bias and out of phase at positive bias between the topographic images and Di/Dv mappings. The defects also show higher tunneling conductance than the h-BN sheet in the Di/Dv mappings. The observed nano-ripples in the defects might indicate interesting electronic properties, such as charge density wave (CDW).

The other type of defcts are the linear boundaries of h-BN. The tilting angle between the two domains at the both sides of the boundary is about 90°, which is well in line with our simulations. From the Di/Dv mapping, the boundary shows lower tunneling conductance than the h-BN sheet, which is different from the first type of quasi-1D defects.

Our experimental results demonstrate that the existence of quasi-1D defects tramendously affect the structure and electronic properties of h-BN, thus could be used to tune the transport properties in h-BN-based nanodevices.

This research was conducted at the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility, and supported by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the US DOE.