AVS 62nd International Symposium & Exhibition
    Selective Deposition as an Enabler of Self-Alignment Focus Topic Thursday Sessions
       Session SD+AS+EM-ThM

Paper SD+AS+EM-ThM11
Area Selective Deposition of Ultrathin Magnetic Cobalt Films via Atomic Layer Deposition

Thursday, October 22, 2015, 11:20 am, Room 210F

Session: Fundamentals of Selective Deposition
Presenter: John Ekerdt, University of Texas at Austin
Authors: J. Ekerdt, University of Texas at Austin
H. Nallan, University of Texas at Austin
T. Ngo, University of Texas at Austin
S. Chopra, University of Texas at Austin
Z. Zhang, University of Texas at Austin
Correspondent: Click to Email

Ferromagnetic thin films find applications in a variety of fields, such as electronics, spintronics, RF technology, energy, etc. With ever-decreasing device feature sizes, film conformity and crystalline structure become very important to determining magnetic properties. As such, atomic layer deposition (ALD) is a very attractive technique for magnetic film deposition as it ensures atomic level conformity. Since ALD film growth necessarily involves a film nucleation step, it is possible to engineer the surface energy of the substrate to cause preferential wetting and nucleation in only desired areas, resulting in area selective ALD (AS-ALD). Unlike conventional photolithography-based fabrication, a bottom-up patterning approach could eliminate the need for etch steps, reducing the cost of fabrication and overcoming scaling limitations in manufacturing devices. This work investigates the selective deposition of cobalt oxide via ALD that is subsequently reduced to carbon-free cobalt metal for use as the free magnetic layer within the magnetic tunnel junction of spin-transfer torque random access memory.

Alkylchlorosilanes and poly(trimethylsilylstyrene) are utilized to block water and cobalt bis(N-tert butyl, N'-ethylpropionamidinate) from an oxide substrate, such as silicon dioxide, hafnium dioxide and magnesium oxide, ensuring selective deposition of CoO films. Poly(trimethylsilylstyrene) is the half of a lamellar forming diblock copolymer that remains after self-assembly and feature development. The alkylchlorosilanes can be blanket deposited through the vapor phase or stamped onto the oxide surface using a poly(dimethylsiloxane) stamp. Cobalt oxide ALD proceeds on the exposed oxide surface. Strontium and Al are deposited atop the CoO films to scavenge oxygen during thermal annealing to yield cobalt metal films. Alternatively, reducing gases such as CO and H2 can be employed as an oxygen sink during thermal reduction of CoO to Co metal. Finally, we demonstrate control over the tunability of the coercivity of the resultant films by controlling the reduction conditions.