AVS 62nd International Symposium & Exhibition
    Nanometer-scale Science and Technology Tuesday Sessions
       Session NS+EN+SS-TuA

Paper NS+EN+SS-TuA12
Efficient Coupling of Visible Light to Thin Film Waveguides; FDTD Field Model Results for Nanometer Scale Graded Index/Waveguide Structures.

Tuesday, October 20, 2015, 6:00 pm, Room 212B

Session: Nanophotonics, Plasmonics, and Energy
Presenter: Adam Lambert, AVS
Authors: A. Lambert, AVS
E. Demaray, AVS
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Previous work utilizing Finite Difference Time Domain (FDTD) models with 20 nm resolution demonstrated normal incident plane wave AM 1.5 solar light could be coupled and concentrated into modes of a lateral duct with ~ 91% efficiency for tapered concentrator with spatially uniform refractive index. However, for efficient coupling and mode compression into high index waveguides in advanced devices, continuously graded index films on the order of 150-200nm with nonlinear profiles have been shown to be near ideal anti-reflective coatings which Antropy Technology can now produce at high volume using modern sputter coating processes. Such devices could be revolutionary not only in the field of photonics, but could also open the path for an wide variety of green energy and advanced lighting applications. This presentation focuses on current advances in the parametric investigation of nonlinear refractive index profiles and related sputter coating production processes. The FDTD problem solving framework provides the fully resolved time dependent propagation of the electromagnetic field, accounting for the nonlinear influence of subwavelength structures and allowing for detailed design of the thin film product. We are reporting resolution capabilities are in the 1-5nm range depending on the relevant length scales for the process. Quantification of power, absorption/heat, and other variables relevant to R&D can easily be extracted during post processing. Parallel Monte Carlo simulations predict the refractive index profile resulting from dual source, inline, biased pulse DC sputter coating. The combination allows for highly accurate feasibility studies and front end process design. Both quantified numerical results as well as qualitative animations of the influence of the subwavelength devices are presented for both processes, as well as a detailed overview of the potential applications.