AVS 62nd International Symposium & Exhibition
    Electronic Materials and Processing Monday Sessions
       Session EM+AS+SS-MoA

Paper EM+AS+SS-MoA10
Geometrically Asymmetric Tunneling Nanostructures by Atomic Layer Deposition

Monday, October 19, 2015, 5:20 pm, Room 211A

Session: MIM Diodes, Functional Oxides, and TFTs
Presenter: Jie Qi, University of Connecticut
Authors: J. Qi, University of Connecticut
X. Jiang, University of Connecticut
B.G. Willis, University of Connecticut
Correspondent: Click to Email

Geometrically asymmetric tunneling nanostructures are of interest to make ultra-high frequency diodes for applications in detection and solar energy harvesting. Atomic layer deposition (ALD) is one of the most promising techniques for fabrication of tunneling nanostructures. In previous work, it has been demonstrated that individual metal-vacuum-metal (MVM) tunnel junctions with a gap distance of 1-2 nm can be fabricated by selective-area ALD of Cu onto Pd templates. However, optimizing nonlinearity and scaling up to large arrays of tunneling devices both introduce new challenges that include achieving precise control of nucleation and good quality conformal growth on sharply defined asymmetric nanostructures.

​In this study, the fabrication of large arrays of MVM tunnel junctions is investigated using selective-area ALD. Nano-patterned Pd nanostructures with sharp asymmetric features are prepared as seed layers for planar, geometrically-asymmetric junctions on SiO2 / silicon substrates by high-resolution electron beam lithography. Selective-area ALD applied to patterned Pd nanostructures allows tuning the size of junctions to nanometer dimensions. Microscopy and chemical analysis are used to evaluate nanostructure morphology, tunnel junction uniformity, and selective area growth characteristics. In-situ electrical measurements are used to measure DC current-voltage curves and nonlinearity. It was found that film nucleation and growth selectivity can be greatly affected by different pre-deposition sample treatments. UV/Ozone (UVO) cleaning and hydrogen annealing before ALD both enhance the nucleation of Cu thin films on Pd seed layers. In addition, UVO treatment promotes selective growth on Pd vs. SiO2 areas while boiling samples in water to hydroxylate SiO2 surface area contributes to a loss of selectivity. In-situ measured electrical data during ALD growth demonstrate a gradual convergence to tunneling with sub-nm control provided by the ALD method. However, control of tunneling non-linearity and geometric asymmetry is complicated by an incomplete understanding of the growth mechanism and the morphology evolution of nanostructures. There is a compromise between conditions that promote good ALD growth and those that maintain geometric asymmetry. We conclude with suggestions to promote growth, maintain sharp asymmetric features, and achieve non-linear tunneling characteristics.