AVS 62nd International Symposium & Exhibition
    Spectroscopic Ellipsometry Focus Topic Thursday Sessions
       Session EL+AS+BI+EM-ThA

Paper EL+AS+BI+EM-ThA4
Vector Magneto-Optical Generalized Ellipsometry on Heat Treated Sculptured Thin Films: A Study of the Effects of Al2O3 Passivation Coatings on Magneto-Optical Properties

Thursday, October 22, 2015, 3:20 pm, Room 112

Session: Optical Characterization of Nanostructures and Metamaterials
Presenter: Chad Briley, University of Nebraska-Lincoln
Authors: C. Briley, University of Nebraska-Lincoln
A. Mock, University of Nebraska-Lincoln
D. Schmidt, National University of Singapore
T. Hofmann, University of Nebraska-Lincoln
E. Schubert, University of Nebraska-Lincoln
M. Schubert, University of Nebraska-Lincoln
Correspondent: Click to Email

We present the vector magneto-optical generalized ellipsometric (VMOGE) response1 and model dielectric function (MDF) anisotropic hysteresis calculations2 of ferromagnetic slanted columnar thin films under the effects of heat treatment up to 475° C. Directional hysteresis magnetization scans were performed with an octu-pole vector magnet at room temperature on Cobalt slanted columnar thin film samples grown by glancing angle deposition with and without Al2O3 conformal passivation overcoating done by atomic layer deposition. Analysis of the measured Mueller matrix ellipsometric data through a point-by-point best match model process determine the magneto-optical (MO) dielectric tensor. Three dimensional rendering of the anti-symmetric off-diagonal elements of the MO dielectric tensor displays anisotropic magnetic response of the thin film with the hard axis along the long axis of the columns. Data analysis reveals the preservation of anisotropic magneto-optical properties of the thin film with the passivated coating as compared to the non-passivated coating due to oxidation effects from heat treatment.

1) D. Schmidt, C. Briley, E. Schubert, and M. Schubert, Appl. Phys. Lett. 102, 123109 (2013).

2) C. Briley, D. Schmidt, T. Hofmann, E. Schubert, and M. Schubert, Appl. Phys. Lett. 106, 133104 (2015).