AVS 62nd International Symposium & Exhibition
    Atom Probe Tomography Focus Topic Monday Sessions
       Session AP+AS-MoA

Paper AP+AS-MoA3
Comparing APT Mass Spectral Ranging for Compositional Accuracy: A Case Study with Cast Duplex Stainless Steels

Monday, October 19, 2015, 3:00 pm, Room 230A

Session: Current and New Research Fields for Applications of Atom Probe Tomography
Presenter: Daniel Perea, Pacific Northwest National Laboratory
Authors: D.E. Perea, Pacific Northwest National Laboratory
A. Eaton, Pacific Northwest National Laboratory
J. Liu, Pacific Northwest National Laboratory
S. Mburu, University of Maryland
S. Schwarm, University of Maryland
R. Kolli, University of Maryland
S. Ankem, University of Maryland
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The mass spectrum of an atom probe tomographic analysis is a superposition of correlated mass-to-charge-state peaks and uncorrelated background counts. The compositional accuracy of a volume of material measured via atom probe tomographic analysis is dependent upon the manner in which the individual mass spectral peaks are ranged for integration. However, an accurate calculation of composition can be challenging due to a combination of complicated peak shapes, peak overlap, and background counts. Using data from both the α–ferrite and γ–austenite phases of a cast duplex stainless steel , we illustrate a methodology to account for the background counts, as well as to deconvolute overlapping peaks, in order to calculate composition that we compare to energy dispersive x-ray spectroscopy measurements.