AVS 62nd International Symposium & Exhibition
    2D Materials Focus Topic Tuesday Sessions
       Session 2D+EM+NS+SS+TF-TuM

Paper 2D+EM+NS+SS+TF-TuM2
Opposite Dependence of Microwave-Induced vs. Field-Induced Imaging Contrast in NV- based Fluorescence Microscopy as Function of Optical Excitation

Tuesday, October 20, 2015, 8:20 am, Room 212C

Session: Optical and Optoelectronic Properties of 2D Materials
Presenter: Etienne Goovaerts, University of Antwerp, Belgium
Authors: E. Goovaerts, University of Antwerp, Belgium
S.K.R. Singam, University of Antwerp, Belgium
M. Nesladek, Hasselt University, Belgium
M. Giugliano, University of Antwerp, Belgium
Correspondent: Click to Email

The charged nitrogen-vacancy (NV-) center is a remarkable defect in diamond which allows interrogation of spin state through its fluorescence. Among the proposed applications, background-free imaging based on fluorescent nanodiamond (FND) was demonstrated [1-3]. The FNDs emission can be discriminated from spurious fluorescence by switching on resonant microwaves (MW) and/or a static magnetic field [1-3], as demonstrated in cells [1] and potentially in small animals [2]. It is now important to understand the origin of the contrast in either of these approaches, and the optimal experimental parameters.

NV- defects in single-crystal diamond as well as in FNDs were excited by a 532nm laser through the microscope objective. A compact spectrometer combined with appropriate filters allowed to measure the NV- and NV0 emission. MW-induced contrast is achieved using a broadband circular antenna (i.d. 1mm) on a printed plate, and for field-induced contrast we use a small-sized permanent magnet (~300mT). They are placed closely behind the sample with in each case the magnetic field component along the optical axis of the objective.

For shallow implanted NV in (100) diamond as well as for FNDs the fluorescence is quenched by application of either resonant MWs or static field, with contrast levels systematically higher in the single crystal case than for deposited nanoparticles. The contrast values were measured for laser powers covering 6 orders of magnitude. After an initial rise at very low excitation (max. 13% in crystal, 7% in FND), the MW-induced contrast significantly decreases at higher laser powers. In parallel, field-induced contrast increases from about 12% to values of 38% and 20% for the single crystal and FNDs. This is described under steady state conditions using a 5-level model that includes radiative and nonradiative decay and ground state spin relaxation. The MW-contrast results from induced spin transitions in the triplet ground state while the field effect relies on state mixing within the ground and the excited triplets which change the decay rates. The analysis also shows that the applied excitation rates runs through 3 regimes from below the spontaneous relaxation rate, via an intermediate regime, to above the decay rate of the intermediate singlet.

This work demonstrates the advantages of field-induced contrast microscopy over the MW-induced approach. These become particularly important at high excitation rates which are more often applied in confocal microscopy.

[1] R. Igarashi, et al, Nano Lett. 2012, 12, 5726

[2] A. Hegyi, E. Yablonovitch, Nano Lett. 2013,13, 1173

[3] R. Chapman, T. Plakkhoitnik, Opt. Lett. 2013, 38, 1847