AVS 61st International Symposium & Exhibition
    Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic Tuesday Sessions

Session SA-TuM
Characterization of Nanostructured and LD Materials Using Synchrotron-Based Methods

Tuesday, November 11, 2014, 8:00 am, Room 312
Moderator: Maya Kiskinova, Elettra-Sincrotrone Trieste, Italy


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

8:00am SA-TuM1 Invited Paper
Analysis and Speciation of Nanoscaled Materials by Means of Grazing-Incidence and High-Resolution X-ray Spectrometry
Burkhard Beckhoff, M. Gerlach, I. Holfelder, P. Hoenicke, J. Lubeck, M. Mueller, A. Nutsch, B. Pollakowski, C. Streeck, R. Unterumsberger, J. Weser, Physikalisch-Technische Bundesanstalt (PTB), Germany
8:40am SA-TuM3 Invited Paper
X-Ray Photoemission Spectromicroscopy: Recent Achievements and Future Applications
Claus Schneider, Forschungszentrum Juelich GmbH, Germany
9:20am SA-TuM5 Invited Paper
Growth and Characterization of Low Dimensional Materials for Applications in Energy and Sensor Devices
Andrea Goldoni, Elettra-Sincrotrone Trieste, Italy
11:00am SA-TuM10 Invited Paper
Novel 2D Electron Gases at the Surface of Transition-Metal Oxides: Role of Topology and Spin-Orbit Coupling
Andrés F. Santander-Syro, Université Paris-Sud, France
11:40am SA-TuM12 Invited Paper
Effects of Interfacial Interaction: Electronic Structure of Graphene on Metallic and Insulating Surfaces
Petra Rudolf, University of Groningen, The Netherlands