| AVS 61st International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Tuesday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 2:20pm | SA-TuA1 Invited Paper FEL-Based Techniques to Explore Photochemistry and Transient States of Molecules on Surfaces Wilfried Wurth, Universität Hamburg, Germany |
| 3:00pm | SA-TuA3 Invited Paper Real-time X-ray Photoelectron Spectroscopy Studies of Electronic Dynamics at Molecule-Semiconductor Interfaces Oliver Gessner, Lawrence Berkeley National Laboratory |
| 4:20pm | SA-TuA7 Invited Paper Unraveling Topological Properties of Spintronic Materials Using Coherent X-rays Sujoy Roy, Lawrence Berkeley National Laboratory |
| 5:00pm | SA-TuA9 Invited Paper Where are the Electrons? Charge Transfer and Dissociation from a Femtosecond Electronic-Structure Perspective Philippe Wernet, Helmholtz-Zentrum Berlin (HZB), Germany |
| 5:40pm | SA-TuA11 Layer Speciation and Electronic Structure Investigation of Hexagonal Boron Nitride Thin Film by Scanning Transmission X-ray Microscopy Jian Wang, Canadian Light Source Inc., Canada, Z. Wang, University of Western Ontario, Canada, H. Cho, M.J. Kim, Korea Institute of Science and Technology, Republic of Korea, T.-K. Sham, University of Western Ontario, Canada, X. Sun, Soochow University, China |
| 6:00pm | SA-TuA12 Reference-free, In-depth Characterization of Nanoscaled Materials by Combined X-ray Reflectivity and Grazing incidence X-ray Fluorescence Analysis Philipp Hönicke, M. Müller, Physikalisch-Technische Bundesanstalt, Germany, B. Detlefs, CEA-LETI, France, C. Fleischmann, IMEC, Belgium, B. Beckhoff, Physikalisch-Technische Bundesanstalt, Germany |