| AVS 61st International Symposium & Exhibition | |
| Helium Ion Microscopy Focus Topic | Thursday Sessions |
Click a paper to see the details. Presenters are shown in bold type.
| 8:00am | HI+2D+AS+BI+MC-ThM1 Invited Paper He+ and Ne+ Ion Beam Microscopy and Microanalysis David C. Joy, University of Tennessee, Oak Ridge National Laboratory |
| 8:40am | HI+2D+AS+BI+MC-ThM3 Invited Paper Gas Field Ion Sources Jason Pitters, R. Urban, National Institute for Nanotechnology, Canada, R. Wolkow, University of Alberta and The National Institute for Nanotechnology, Canada |
| 9:20am | HI+2D+AS+BI+MC-ThM5 Ion Beam Profiles Generated by W(111) Single Atom Tips Radovan Urban, R. Wolkow, University of Alberta and The National Institute for Nanotechnology, Canada, J.L. Pitters, National Institute for Nanotechnology, Canada |
| 9:40am | HI+2D+AS+BI+MC-ThM6 Defect Observation by using Scanning Helium Ion Microscopy Hongxuan Guo, L. Zhang, D. Fujita, National Institute for Materials Science (NIMS), Japan |
| 11:00am | HI+2D+AS+BI+MC-ThM10 Invited Paper Helium Ion Microscopy (HIM) for the Imaging of Biological Samples at Sub-nanometer Resolution James Fitzpatrick, Salk Institute for Biological Studies |
| 11:40am | HI+2D+AS+BI+MC-ThM12 Helium Ion Microscopy of Biological Cells Natalie Frese, A. Beyer, M. Schürmann, B. Kaltschmidt, C. Kaltschmidt, A. Gölzhäuser, University of Bielefeld, Germany |
| 12:00pm | HI+2D+AS+BI+MC-ThM13 Helium Ion Microscopy Analysis of Ag Nanoparticle Implanted Biological Samples for MILDI-MS (Matrix Implanted Laser Desorption/Ionization) Imaging S. Shubeita, Rutgers University, L. Muller, NIDA-IRP, H.D. Lee, C. Xu, Rutgers University, D. Barbacci, Ionwerks Inc., K. Baldwin, NIDA-IRP, J.A. Schultz, Ionwerks Inc., L. Wielunski, Torgny Gustafsson, L.C. Feldman, Rutgers University, A.S. Woods, NIDA-IRP |