AVS 61st International Symposium & Exhibition
    Exhibitor Technology Spotlight Wednesday Sessions

Session EW-WeL
Exhibitor Technology Spotlight Session

Wednesday, November 12, 2014, 12:20 pm, Room Hall ABC
Moderator: Chris Moffitt, Kratos Analytical Limited, UK


  Click here to Download program book for this session  
  in Adobe Acrobat format  

Click a paper to see the details. Presenters are shown in bold type.

12:40pm EW-WeL2
An Auger Electron Analyzer System for In Situ Growth Monitoring
W.Laws Calley III, P.G. Staib, Staib Instruments, Inc.
1:00pm EW-WeL3
Safe and Efficient - Dry Bed Exhaust Gas Abatement of Toxic Gases I
Sam Yee, CS Clean Systems Inc.
1:20pm EW-WeL4
The Workstation For Your 2D Characterization Needs - The First Low Temperature MultiProbe SPM-NSOM System Integrated with Raman
David Lewis, Nanonics Imaging Ltd.
1:40pm EW-WeL5
Trends and Solutions of Control Electronics for Surface Analysis and Science
Jacek Latkowski, PREVAC sp. z o. o.