AVS 61st International Symposium & Exhibition
    Atom Probe Tomography Focus Topic Thursday Sessions

Session AP-ThP
Atom Probe Tomography Poster Session

Thursday, November 13, 2014, 6:00 pm, Room Hall D

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Click a paper to see the details. Presenters are shown in bold type.

AP-ThP1
Nanoscale Semiconductor and Oxide Characterization using Atom Probe Tomography
David Larson, M. Ulfig, D. Lenz, D. Lawrence, D. Olson, D.A. Reinhard, T.J. Prosa, P.H. Clifton, T.F. Kelly, CAMECA Instruments Inc.