Invited Paper TF+AS-FrM5
Characterization of Epitaxial Oxides for Electronics, Magnetics, and Photoactivity
Friday, November 14, 2014, 9:40 am, Room 307
Transition metal oxides offer an incredibly rich variety of properties which can be harnessed for countless applications. Unfortunately, this variety can be a curse as well as a blessing: the myriad oxidation states, crystal structures, and defects which may occur in the bulk and/or on the surface of any given oxide system makes it challenging to draw meaningful structure-property relationships without employing a full suite of materials characterization techniques. To keep the system as simple and well-defined as possible, and to explore materials and compositions not easily attainable by equilibrium techniques, epitaxial deposition of oxide thin films is widely utilized. However, even in these “simple” systems, thorough characterization of the crystallinity and structural defects, oxidation state, stoichiometry and dopants is critical. Unwelcome surprises are often found in nominally “good” material when one takes the time to investigate. Our laboratory has explored the electronic, magnetic, and photoactive properties of binary and complex oxides as epitaxial thin films, and several examples illustrating the importance of thorough thin film characterization will be presented. In our work on Cr-doped anatase TiO2, a candidate dilute magnetic semiconductor (DMS), room temperature ferromagnetism was observed that appeared to depend sensitively on “preparation conditions.” We applied several characterization techniques, particularly x-ray diffraction (XRD) and transmission electron microscopy (TEM), and were able to correlate the presence of structural defects with room temperature ferromagnetic ordering. One of the most widely investigated materials as a potential DMS has been Co-doped ZnO, but the presence of intrinsic ferromagnetism in this system has been widely debated in the literature. We investigated very high quality epitaxial thin films with several x-ray absorption-based characterization techniques (XANES, EXAFS, XLD) to disprove the presence of intrinsic ferromagnetism in nominally defect-free material. In more recent work, we have explored the visible-light photoactivity of hematite Fe2O3 doped with Cr or V. XRD, x-ray photoelectron spectroscopy (XPS), scanning TEM (STEM), and XANES/EXAFS have been applied, as well as less widely utilized techniques such as non-Rutherford resonant elastic scattering (RES) to quantitatively measure oxygen stoichiometry non-destructively, and lab-based x-ray photoelectron diffraction (XPD) to elucidate unique surface oxidation features observed by XPS. The structural properties of doped hematite could then be correlated with the bandgap and spectroscopic photoconductivity measurements.