AVS 61st International Symposium & Exhibition | |
Thin Film | Friday Sessions |
Session TF+AS-FrM |
Session: | Thin Film Characterization |
Presenter: | Joseph Rowley, Brigham Young University |
Authors: | J. Rowley, Brigham Young University R.C. Davis, Brigham Young University R.R. Vanfleet, Brigham Young University N. Boyer, Brigham Young University S. Liddiard, Moxtek, Inc M. Harker, Moxtek, Inc L. Pei, Brigham Young University |
Correspondent: | Click to Email |