Paper SS+AS+EN-TuM12
Chemical Characterization of Elements in Oxides using X-ray Satellite Lines

Tuesday, November 11, 2014, 11:40 am, Room 309

X-ray satellite lines come about in x-ray fluorescence spectroscopy as a result of shake-off events in the excitation process. The ratio of their intensities has been shown to be a sensitive function of their oxidation states. We are able to observe the K satellite lines in the x-ray spectra of oxides and glasses, excited by the beam of an electron microscope and detected by a high resolution x-ray microcalorimeter detector. The results show surprising departures from the expected states of some metal elements that we expect to be fully oxidized. The satellite ratio is a way of determining the chemical environment of insulators without charging or ultra-high vacuum.