AVS 61st International Symposium & Exhibition | |
Scanning Probe Microscopy Focus Topic | Thursday Sessions |
Session SP+2D+AS+EM+MC+NS+SS-ThM |
Session: | Probing Electronic and Transport Properties |
Presenter: | Jewook Park, Oak Ridge National Laboratory |
Authors: | J. Park, Oak Ridge National Laboratory L. Liu, The University of Tennessee Knoxville D.A. Siegel, Sandia National Laboratories K.F. McCarty, Sandia National Laboratories L. Basile, ORNL J.-C. Idrobo, ORNL K. Clark, ORNL W. Deng, The Univ. of Tennessee Knoxville C.P. Durand, ORNL G. Gu, The Univ. of Tennessee Knoxville A.P. Li, ORNL |
Correspondent: | Click to Email |