| AVS 61st International Symposium & Exhibition | |
| Novel Trends in Synchrotron and FEL-Based Analysis Focus Topic | Monday Sessions |
| Session SA-MoA |
| Session: | Synchrotron Studies of Processes in Energy Conversion, Electronic Devices and Other Materials II |
| Presenter: | Hans Bechtel, Lawrence Berkeley National Laboratory |
| Authors: | A. Bechtel, Lawrence Berkeley National Laboratory E.A. Muller, University of Colorado at Boulder R.L. Olmon, University of Colorado at Boulder M.C. Martin, Lawrence Berkeley National Laboratory M.B. Raschke, University of Colorado at Boulder |
| Correspondent: | Click to Email |
By combining scattering-scanning near-field optical microscopy (s-SNOM) with mid-infrared synchrotron radiation, synchrotron infrared nano-spectroscopy (SINS) enables molecular and phonon vibrational spectroscopic imaging, with rapid spectral acquisition, spanning the full mid-infrared (500-5000 cm-1) region with nanoscale spatial resolution. This highly powerful combination provides access to a qualitatively new form of nano-chemometric analysis with the investigation of nanoscale, mesoscale, and surface phenomena that were previously impossible to study with IR techniques. We have installed a SINS end-station at Beamline 5.4 at the Advanced Light Source (ALS) at Lawrence Berkeley National Laboratory, making the s-SNOM technique widely available to non-experts, such that it can be broadly applied to biological, surface chemistry, materials, or environmental science problems. We demonstrate the performance of synchrotron infrared nano-spectroscopy (SINS) on semiconductor, biomineral and protein nanostructures, providing vibrational chemical imaging with sub-zeptomole sensitivity.