| AVS 61st International Symposium & Exhibition | |
| Magnetic Interfaces and Nanostructures | Monday Sessions |
| Session MI+EM-MoM |
| Session: | Interfacial Effects in Oxide Heterostructures |
| Presenter: | Hendrik Ohldag, SLAC National Accelerator Laboratory |
| Authors: | H. Ohldag, SLAC National Accelerator Laboratory S. Bonetti, Stanford University R. Kukreja, Stanford University J. Frisch, SLAC National Accelerator Laboratory H. Duerr, SLAC National Accelerator Laboratory J. Stoehr, SLAC National Accelerator Laboratory |
| Correspondent: | Click to Email |
Understanding magnetic properties at ultrafast timescales is crucial for the development of new generations of magnetic devices. Such devices will employ the spin torque or spin Hall effect, whose manifestation at the nanoscale is not yet sufficiently understood, which is why studies addressing these effects are of great fundamental significance as well. The samples of interest are often thin film magnetic multilayers with thicknesses in the range of a atomic layers. This fact alone presents a sensitivity challenge in STXM microscopy, which is more suited toward studying thicker samples. In addition the relevant time scale is of the order of 10 ps, which is well below the typical x-ray pulse length of 50 – 100 ps. Altogether this means that pushing the time resolution of a synchrotron x-ray microscopy experiment is synonymous with improving the signal to noise ratio on the detector and providing stable, low jitter excitation to not further dilute the already small magnetic signals.
The SSRL STXM is equipped with a single photon counting electronics that effectively allows us to use a double lock-in detection at 476MHz (the x-ray pulse frequency) and 1.28MHz (the synchrotron revelation frequency). The pulsed or continuous sample excitation source is synchronized with the synchrotron source with a few picosecond drift over 24 hours. This setup currently allows us to achieve a signal to noise ratio of better than 10000, enabling us to detect miniscule variations of the x-ray absorption cross section.
In this talk I will describe the time resolved STXM setup developed at SSRL and present firsts results that have been obtained using the instrument in collaboration with an outstanding group of external users. The instrument operates in ultra high vacuum (~10-8torr) and allows us to apply electrical pulses to our samples that can be placed in out of plane magnetic fields up to 0.8 Tesla or in plane magnetic fields up to 0.3 Tesla. We have used the instrument to successfully image spin waves excited in spin-torque and spin Hall oscillators with nano contacts of the size of ~100nm. We also succeeded in imaging different excitation modes of magnetic samples in ferromagnetic resonance at 9.6GHz excitation frequency, where the opening angle of the precession cone is of the order of 10mrad.
The facility that is dedicated to ultrafast studies of materials under electric and magnetic fields is open to general users who are interested in this field.