AVS 61st International Symposium & Exhibition | |
In-Situ Spectroscopy and Microscopy Focus Topic | Wednesday Sessions |
Session IS+2D+MC+NS+SP+SS-WeA |
Session: | In-Situ Scanning Microscopy |
Presenter: | Alexander Tselev, Oak Ridge National Laboratory |
Authors: | A. Tselev, Oak Ridge National Laboratory A. Komakov, National Institute of Standards and Technology (NIST) |
Correspondent: | Click to Email |
Many functional objects (and interfaces) have to be studied in situ when the object is immersed in liquid environment. In addition, for energy, chemical, (bio-) medical and other applications, there is a need to study the encapsulated objects, which otherwise can be chemically reactive or toxic. These samples are often mesoscopically small or exist in minuscule quantities. Recently, we have developed a process for preparation of liquid-filled cells sealed with ultrathin membranes. Such cells can be implemented for in-situ studies using, for example, electronor soft x-ray microscopy due to a high transparency of these membranes to electron beams. However, in many cases electron microscopy is an invasive technique due to various electron beam induced parasitic effects (e.g. radiolysis or beam induced deposition). To overcome these impediments, we demonstrate the scanning microwave impedance microscopy (sMIM) to image different nanoscale objects immersed in the liquid environment through 30 nm SiN membranes. In the sMIM, microwaves of a frequency of 3 GHz are sent through a coaxial cable connected to a shielded cantilever probe fully compatible with an AMF microscope. The sharp probe tip provides “focusing effect” for the electric component of the microwave. For imaging, the tip is brought into gentle mechanical contact with a membrane. Amplitude and phase of microwaves reflected from the probe are monitored. Since the wave reflection is dependent on the tip-sample system impedance, reflected waves carry information about sample local properties. The effective distance into the sample depth, where the tip-induced field enhancement takes place, is approximately equal to the tip apex radius. Since the membrane thickness is smaller compared to the tip radius of a typical probe (about 50 nm for a fresh tip), the tip-sample impedance is dependent on the dielectric properties of the material beneath membrane, and therefore, it is possible to “see” through the membrane. We demonstrate imaging of different combinations of model liquids and nanoparticles: water and water-based solutions (ε~80), organic solvents (ε~10-25), and oils (ε~2-3) containing Ni metal, polystyrene (ε~2.5) and PbO (ε~25) particles. This technique can be further implemented for a broad range of objects in confined liquids, and can be used to monitor interfacial electrochemical reactions. Imaging with sMIM was performed at CNMS, which is sponsored at ORNL by the SUFD, BES, US DOE.