| AVS 61st International Symposium & Exhibition | |
| Energy Frontiers Focus Topic | Monday Sessions |
| Session EN+EM+MN+NS+TR-MoA |
| Session: | Energy Harvesting with Nanostructures |
| Presenter: | Hagai Cohen, Weizmann Institute of Science, Israel |
| Correspondent: | Click to Email |
The characterization of multi-interfacial devices commonly encounters critical difficulties due to the limited access of standard electrical probes to selected inner domains. In this respect, the XPS (x-ray photoelectron spectroscopy) based CREM (chemically resolved electrical measurements) [1] is a technique proposing particularly useful capabilities. Demonstration of internal junction fields evaluation has already been provided, as well as the direct measurement of layer-specific photovoltages in ETA (extremely thin absorber) solar cells.[2] However, the complex dynamics realized during charge separation in such cells has not yet been investigated thoroughly by CREM.
The present work focuses on this issue, showing conflicting roles of charge trap states and, specifically, their different expression under controllably varied conditions. Comparison with complementary characterization techniques is further discussed, demonstrating the unique insight provided by CREM for their interpretation.
References
1. H. Cohen, Appl. Phys. Lett.85, 1271 (2004).
2. Y. Itzhaik, G. Hodes, H. Cohen, J. Phys. Chem. Lett.2, 2872 (2011).