AVS 61st International Symposium & Exhibition | |
Energy Frontiers Focus Topic | Wednesday Sessions |
Session EN+AS+EM+SE-WeM |
Session: | Thin Film Photovoltaics |
Presenter: | Colin Wolden, Colorado School of Mines |
Authors: | D. Meysing, Colorado School of Mines J.J. Li, Colorado School of Mines J. Beach, Colorado School of Mines T.R. Ohno, Colorado School of Mines M.O. Reese, National Renewable Energy Laboratory T.M. Barnes, National Renewable Energy Laboratory C.A. Wolden, Colorado School of Mines |
Correspondent: | Click to Email |
Cadmium sulfide is the most commonly employed window layer in the front contact, and its properties can greatly affect cell performance through optical absorption and the quality of the CdS-CdTe junction. In this work, we develop reactive sputtering as an alternative to chemical bath deposition (CBD) for the production of oxygenated cadmium sulfide (CdS:O) to enable high efficiency CdTe solar cells. The intrinsic properties of CdS:O as well as their impact on device performance were studied by varying the oxygen content in the Ar sputtering ambient over the range of 0–10%. XRD, RBS, XPS, and spectrophotometry were used to measure the crystal structure, composition, bonding, and optical properties, respectively. The variation in properties is unsurprisingly non-linear, and optimal performance is attributed to a compromise between optical transmission, which improve monotonically with oxygen content, and band alignment which sharply attenuates device performance beyond a critical threshold.
It is notoriously difficult to make a good ohmic contact to CdTe using conventional metals, because this requires a work function of greater than 5.7 eV. Copper-doped zinc telluride (ZnTe:Cu) is one of the most commonly employed buffer layers to mitigate this issue. ZnTe was identified due to its valence band alignment and compatibility with CdTe. Copper has both positive and deleterious effects and it is critical to precisely control both its amount and spatial distribution in order to obtain high efficiency. We have developed a back contacting procedure that employs rapid thermal processing (RTP) to deliver precise control over the activation and distribution of Cu. The RTP process is coupled with atom probe tomography and advanced optoelectronic characterization to improve our understanding of the structure-property-performance relationships in this system. The advances achieved here using commercially scalable processes are combined to produce devices with Voc > 850 mV and efficiencies exceeding 16%.