| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS-ThP |
| Session: | Applied Surface Science Poster Session |
| Presenter: | Bill Sgammato, Thermo Fisher Scientific, UK |
| Correspondent: | Click to Email |
Characterization of catalytic systems benefits from analysis with multiple surface analysis techniques. X-ray Photoelectron Spectroscopy (XPS), for example, is the ideal technique for identifying different chemical species present within the top 10nm of a catalyst surface, but if the elemental composition of the top monolayer is to be investigated then Ion Scattering Spectroscopy (ISS) is the preferred analytical technique. Additionally, if the surface electronic structure can be analyzed, using Ultraviolet Photoelectron Spectroscopy (UPS), then it may be possible to correlate catalytic activity with electronic structure enabling the analyst to identify the chemical species and active sites responsible for catalytic reactions.
This work demonstrates how a single, multi-technique surface analysis system can be used to comprehensively characterize a catalytic system. XPS, ISS and UPS data is presented.