| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Thursday Sessions |
| Session AS-ThP |
| Session: | Applied Surface Science Poster Session |
| Presenter: | Thomas Levesque, Thermo Fisher Scientific |
| Authors: | R.G. White, Thermo Fisher Scientific, UK T. Levesque, Thermo Fisher Scientific |
| Correspondent: | Click to Email |
X-ray Photoelectron Spectroscopy (XPS) is well known for its surface specificity and chemical selectivity. By studying the small binding energy shifts of core level spectra, the analyst may identify the chemical bonding environments of elements present in the surface. When electronic structure or valence information is required, however, many analysts will turn to Ultraviolet Photoelectron Spectroscopy (UPS). There have been many publications in the literature which demonstrate that XPS can also provide electronic and valence information, ranging from work function measurements to valence bonding information.
This work demonstrates the utility of XPS for such measurements and compares results from the same sample set using the complementary techniques of XPS and UPS.