| AVS 61st International Symposium & Exhibition | |
| Applied Surface Science | Wednesday Sessions |
| Session AS+BI+MC-WeA |
| Session: | Practical Surface Analysis I |
| Presenter: | Justin Gorham, National Institute of Standards and Technology (NIST) |
| Authors: | J.M. Gorham, National Institute of Standards and Technology (NIST) J. Woodcock, National Institute of Standards and Technology (NIST) W.A. Osborn, National Institute of Standards and Technology (NIST) J. Heddleston, National Institute of Standards and Technology (NIST) K. Scott, National Institute of Standards and Technology (NIST) |
| Correspondent: | Click to Email |
Carbon nanotubes (CNT) have been widely incorporated into composite systems due to the enhanced properties that they add to new and existing products, especially with respect to mechanical strength. X-ray photoelectron spectroscopy (XPS), in conjunction with SEM and Raman spectroscopy, has been employed in efforts to characterize several CNT: epoxy composite systems. This characterization approach was applied to composite systems with (1, 4 and 5) CNT weight percentages. Additionally, imaging XPS results will be presented to provide further insight into the dispersion quality on the micron scale. Challenges associated with overlapping spectral features, charging and a variety of other considerations regarding the surface and the bulk of the sample will be discussed.