AVS 61st International Symposium & Exhibition | |
2D Materials Focus Topic | Thursday Sessions |
Session 2D-ThP |
Session: | 2D Materials Poster Session |
Presenter: | Aaron Lewis, Hebrew University of Jerusalem, Israel |
Authors: | J. Ernstoff, Nanonics Imaging Ltd., Israel A. Lewis, Hebrew University of Jerusalem, Israel O. Zinoviev, Nanonics Imaging Ltd., Israel A. Komissar, Nanonics Imaging Ltd., Israel E. Maayan, Nanonics Imaging Ltd., Israel |
Correspondent: | Click to Email |
This presentation will address the revolution that is occurring in 2D materials such as Graphene, MoS2, WeSe2, etc., and the variety of measurement modalities that are needed to fully understand these materials at cryogenic temperatures.
It is a challenge to study such materials at temperatures down to 10oK when one considers the wide variety of physical phenomena that have to be applied to get a full picture of the functionality of the material under study. This involves questions of structure, nanometric photoconductivity, electrical properties, thermal properties, near-field optical in the apertured and scattering modes, Kelvin probe, and of course Raman. All of these phenomena are common not only to 2D materials but also to carbon nanotubes.
Today’s scientific challenges demand a system where one can image these phenomena and correlate such images with the nanometric structure of the material under study. This requires a multiprobe scanned probe microscopy system working at such extreme temperatures, which allows for multiple SPM on-line while maintaining complete optical accessibility. More specifically, the probes which can investigate near-field photoconductivity and Kelvin probe have to be capable of being on-line at the same time and also come into contact with one another to obtain overlapping images of nanometric spaces while still allowing for reflection Raman. This is necessary as many of these systems are incorporated into opaque devices. Such a system will be presented in this presentation with results on graphene.